Patents: | | PAT. NO. | Title | | 1 | 5,995,541 | Method and apparatus for self-calibration and testing of QPSK transmitter/receiver IC's | | 2 | 5,892,376 | High-speed/high-slew-rate tri-modal all bipolar buffer/switch and method thereof | | 3 | 5,808,499 | Quadrature signal generator with spike-less prescalar circuit | | 4 | 5,790,943 | Dynamic range extension of a log amplifier with temperature and process compensation | | 5 | 5,606,272 | Comparator with smooth start-up for high frequencies | | 6 | 5,596,299 | IF amplifier/limiter with positive feedback | | 7 | 5,338,985 | Low voltage, simplified and temperature compensated logarithmic detector | | 8 | 5,296,761 | Temperature-compensated logarithmic detector having a wide dynamic range | | 9 | 5,513,275 | B. Khalaj, H. Aghajan, and T. Kailath, Automated Direct Patterned Wafer Inspection, issued April 30, 1996 |
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